Group Facilities


Materials Characterization

Scanning electron microscope (SEM) – Hitachi SU5000

(Department Shared Facility) Innovative analytical field emission SEM (FE-SEM) allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination.

X-ray diffraction (XRD) – Bruker D8 Discover

(Department Shared Facility) The D8 DISCOVER Model of X-ray Diffraction System, manufactured by Bruker AXS Inc., is mainly used for phase, texture, stress and reflectometry analysis. This device is specifically designed for materials research applications. It is configured in D8 DISCOVER with DAVINCI design that maximizes ease-of-use with real-time component detection. Moreover, it is suitable for use to switch between all materials research X-ray diffraction utilization

Transmission electron microscope (TEM) with EELS & EDS – JEOL JEM-2100F

(Department Shared Facility) The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries

Raman Spectroscopy – Horiba LabRAM 300

(Department Shared Facility) The LabRAM systems are ideally suited to both micro and macro measurements, and offer advanced confocal imaging capabilities. The true confocal microscope enables the most detailed analyses to be obtained with speed and confidence

X-ray photoelectron spectroscopy (XPS) – Kratos Axis Ultra DLD

(Department Shared Facility) Axis Ultra DLD is an X-ray photoelectron spectrometer (XPS) with unrivalled ease of use for materials surface characterisation

Atomic Force Microscopy (AFM) – Bruker DI 3100 SPM

(Department Shared Facility) AFM is a type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by “feeling” or “touching” the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable very precise scanning

Fourier transform infrared spectroscopy (FTIR) – Thermo Scientific Nicolet iS5

The Thermo Scientific™ Nicolet iS5 FT-IR Spectrometer offers the perfect performance, fit and value. It is the ideal spectrometer for product assurance testing and material identification for industrial, government and academic labs around the world


Properties and Device Characterization

Air photoemission system with scanning Kelvin probe – APS04-KP Technology

The APS04 systems measure the absolute work function of a material by Photoemission in Air, no vacuum required. With an excitation range of 3.3eV to over 7eV, the APS04 systems are capable of measuring the absolute Work Function of Metals and the full bands of Semicondcutors can be measured in one system, no other product can do this

Ultra-violet/visible transmission/reflectance/absorption spectroscopy with integrating sphere – PerkinElmer Lambda 650S

The Lambda 650S soectrometer is a versatile instrument peration in the ultraviolet and visible spectral ranges. The spectrometer features a double-beam, double-monochromator, ratio-recording otpical system

External Quantum Efficiency system – LOT SpeQuest

Apart from IV curves, the most important measurement on solar cells is that of the quantum efficiency. Our SpeQuest system is based on monochromatic light sources for measurements in the UV range

Current-voltage (IV) measurement station – LOT IV Station

The basis for IV curve measurements of solar cells is a temporally stable illumination spectrum close to that of the sun, provided by a solar simulator. If the solar simulator is combined with a contacting unit, a source meter as electronic load and corresponding controlling and analyzing software you have a complete IV curve measurement system

Photoluminescence (PL) measurement system – Agilent Cary Eclipse

Computer-controlled ratioing fluorescence spectrophotometer with measurement modes for fluorescence, phosphorescence, chemiluminescence and bioluminescence. Czerny-Turner 0.125 m monochromators, 190–1100 nm wavelength range, fixed selectable SBW from 1.5 to 20 nm, full spectrum Xe pulse lamp single source with exceptionally long life, horizontal beam geometry, dual R928 PM tubes


Deep level transient spectroscopy (DLTS) – Semilab DLS

DLTS is a powerful tool for the study of electrically active defects (known as traps) in semiconductors. DLTS is a destructive technique, as it requires forming either a Schottky diode or a p-n junction with a small sample. Majority carrier traps are observed by the application of a reverse bias pulse, while minority carrier traps can be observed by the application of a forward bias pulse.


In-house built nano-synthesis/device fabrication systems


Hybrid plasma-liquid system for the synthesis and surface engineering of nanoparticles directly in colloids
Related Publications:
Microplasma Processed Ultrathin Boron Nitride Nanosheets for Polymer Nanocomposites …
Enhanced Dispersion of TiO2 Nanoparticles in a TiO2/PEDOT:PSS Hybrid …
A silicon nanocrystal/polymer nanocomposite as a down-conversion layer in organic …
Microplasma-Induce Liquid Chemistry for Stabilizing of Silicon Nanocrystals Optical …
Synthesis of surfactant-free electrostatically stabilized gold nanoparticles by …
Built-In Charges and Photoluminescence Stability of 3D Surface-Engineered Silicon …
Improved Optoelectronic Properties of Silicon Nanocrystals/Polymer Nanocomposites by …
Dramatic Enhancement of Photoluminescence Quantum Yields for Surface-Engineered …
Surface-engineered silicon nanocrystals
Plasma–Liquid Interactions at Atmospheric Pressure for Nanomaterials Synthesis and …
Silicon Nanocrystals in Liquid Media: Optical Properties and Surface Stabilization by …
Microplasma-induced surface engineering of silicon nanocrystals in colloidal dispersion


Synthesis and deposition of compact and nanostructured metal oxide films and device fabrication
Related Publications:
Porous zinc oxide nanocrystalline film deposition by atmospheric pressure plasma …
Low-Temperature Atmospheric Pressure Plasma Processes for “Green” Third Generation …
Tailoring microplasma nanofabrication: from nanostructures to nanoarchitectures
Atmospheric-Microplasma-Assisted Nanofabrication: Metal and Metal–Oxide …
Monoclinic β-MoO3 nanosheets produced by atmospheric microplasma: application …
Reactive Evaporation of Metal Wire and Microdeposition of Metal Oxide Using …


Synthesis of silicon-based with a variety of precursor delivery approaches for investigation of new materials compositions
Related Publications:
Silicon-based quantum dots: synthesis, surface and composition tuning with …
The interplay of quantum confinement and hydrogenation in amorphous silicon …
Crystalline Si nanoparticles below crystallization threshold: effects of collisional heating …


Synthesis of silicon-based nanocrystals and direct deposition on substrate for device fabrication
Related Publications:
Energy band diagram of device-grade silicon nanocrystals


Synthesis and investigation of metal and nitride nanoparticles
Related Publications:


High throughput synthesis of carbon nanotubes and composites
Related Publications: