Shared Materials Characterization Facilities

 

X-ray Photoelectron Spectrometer (XPS) – ESCALAB XI+-Thermo Fisher Scientific

Available soon …

Scanning electron microscope (SEM) – Hitachi SU5000

(Department Shared Facility) Innovative analytical field emission SEM (FE-SEM) allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination.

X-ray diffraction (XRD) – Bruker D8 Discover

(Department Shared Facility) The D8 DISCOVER Model of X-ray Diffraction System, manufactured by Bruker AXS Inc., is mainly used for phase, texture, stress and reflectometry analysis. This device is specifically designed for materials research applications. It is configured in D8 DISCOVER with DAVINCI design that maximizes ease-of-use with real-time component detection. Moreover, it is suitable for use to switch between all materials research X-ray diffraction utilization

Transmission electron microscope (TEM) with EELS & EDS – JEOL JEM-2100F

(Department Shared Facility) The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries

Raman Spectroscopy – Horiba LabRAM 300

(Department Shared Facility) The LabRAM systems are ideally suited to both micro and macro measurements, and offer advanced confocal imaging capabilities. The true confocal microscope enables the most detailed analyses to be obtained with speed and confidence

X-ray photoelectron spectroscopy (XPS) – Kratos Axis Ultra DLD

(Department Shared Facility) Axis Ultra DLD is an X-ray photoelectron spectrometer (XPS) with unrivalled ease of use for materials surface characterisation

Atomic Force Microscopy (AFM) – Bruker DI 3100 SPM

(Department Shared Facility) AFM is a type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by “feeling” or “touching” the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable very precise scanning

Fourier transform infrared spectroscopy (FTIR) – Thermo Scientific Nicolet iS5

The Thermo Scientificâ„¢ Nicolet iS5 FT-IR Spectrometer offers the perfect performance, fit and value. It is the ideal spectrometer for product assurance testing and material identification for industrial, government and academic labs around the world